ACOUSTIC MICROSCOPYNONGAILLARD B.1980; LECTURE NOTES PHYS.; DEU; DA. 1980; NO 112; PP. 423-431; BIBL. 8 REF.Conference Paper

SINGLE LENS TRANSMISSION SCANNING ACOUSTIC MICROSCOPEMOROZOV AI; KULAKOV MA.1980; ELECTRON LETTERS; GBR; DA. 1980; VOL. 16; NO 15; PP. 596-597; BIBL. 8 REF.Article

OPTIMIZATION OF A TRANSMISSION ACOUSTIC MICROSCOPE.BRIDOUX E; NONGAILLARD B; ROUVAEN JM et al.1978; J. APPL. PHYS.; U.S.A.; DA. 1978; VOL. 49; NO 2; PP. 574-579; BIBL. 4 REF.Article

DELINEATION OF SHALLOW JUNCTIONS IN SILICON BY TRANSMISSION ELECTRON MICROSCOPYSHENG TT; MARCUS RB.1981; J. ELECTROCHEM. SOC.; ISSN 0013-4651; USA; DA. 1981; VOL. 128; NO 4; PP. 881-884; BIBL. 10 REF.Article

INTERSTITIAL SUPERSATURATION NEAR PHOSPHORUS-DIFFUSED EMITTER ZONES IN SILICONSTRUNK H; GOSELE U; KOLBESEN BO et al.1979; APPL. PHYS. LETTERS; USA; DA. 1979; VOL. 34; NO 8; PP. 530-532; BIBL. 17 REF.Article

TRANSMISSION SCANNING ACOUSTIC MICROSCOPY WITH APPLICATIONS TO NONDESTRUCTIVE TESTING AND EVALUATIONTSAI CS; LEE CC; WANG JK et al.1979; INTERNATION. LAB.; USA; DA. 1979; VOL. 9; NO 3; PP. 89-92; (3 P.); BIBL. 5 REF.Article

TRANSMISSION SCANNING ACOUSTIC MICROSCOPY: WITH APPLICATIONS TO NONDESTRUCTIVE TESTING AND EVALUATIONTSAI CS; LEE CC; WANG JK et al.1979; AMER. LAB.; USA; DA. 1979; VOL. 11; NO 4; PP. 16-22; (3 P.); BIBL. 5 REF.Article

IMAGE DE L'OBJET DANS UN MICROSCOPE ELECTRONIQUE A TRANSMISSION EN PRESENCE DE CHAMPS ELECTRIQUESBUNDZA BP; KULYUPIN YU A; NEPIJKO SA et al.1979; ZH. TEKH. FIZ.; SUN; DA. 1979; VOL. 49; NO 1; PP. 130-133; BIBL. 3 REF.Article

SCANNING TRANSMISSION ELECTRON MICROSCOPY: MICROANALYSIS FOR THE MICROELECTRONIC AGEBROWN LM.1981; J. PHYS. F; ISSN 0305-4608; GBR; DA. 1981; VOL. 11; NO 1; PP. 1-26; BIBL. 2 P.Article

ELECTRON IMAGING TECHNIQUESWADE RH.1980; LECTURE NOTES PHYS.; DEU; DA. 1980; NO 112; PP. 336-346; BIBL. 33 REF.Conference Paper

A PRACTICAL PROCEDURE FOR ALIGNMENT OF A HIGH RESOLUTION ELECTRON MICROSCOPEZEMLIN F.1979; ULTRAMICROSCOPY; NLD; DA. 1979; VOL. 4; NO 2; PP. 241-245; BIBL. 3 REF.Article

A TV SYSTEM FOR IMAGE RECORDING AND PROCESSING IN CONVENTIONAL TRANSMISSION ELECTRON MICROSCOPY.HERRMANN KH; KRAHL D; RUST HP et al.1978; ULTRAMICROSCOPY; NLD; DA. 1978; VOL. 3; NO 2; PP. 227-235; BIBL. 9 REF.Article

A DETECTION METHOD FOR PRODUCING PHASE AND AMPLITUDE IMAGES SIMULTANEOUSLY IN A SCANNING TRANSMISSION ELECTRON MICROSCOPE.DEKKERS NH; DE LANG H.1977; PHILIPS TECH. REV.; NETHERL.; DA. 1977; VOL. 37; NO 1; PP. 1-9; BIBL. 16 REF.Article

GIANT CELL FORMATION PRODUCED BY LASER MICROBEAM IRRADIATION OF CHROMATIN IN CHINESE HAMSTER CELLSCREMER T; TURNER A; LIH HUEILIAW et al.1981; EXP. CELL RES.; ISSN 0014-4827; USA; DA. 1981; VOL. 134; NO 1; PP. 49-63; BIBL. 36 REF.Article

REDUCTION OF EXTRANEOUS X-RAYS IN A JEM-100C TRANSMISSION ELECTRON MICROSCOPEWITCOMB MJ.1981; MICRON; ISSN 0047-7206; GBR; DA. 1981; VOL. 12; NO 1; PP. 5-12; BIBL. 12 REF.Article

FURTHER OBSERVATIONS ON GLARE IN TRANSMITTED LIGHT MICROSCOPYDODGE AV; WHITE GW.1980; MICR., J. QUEKETT MICR. CLUB; GBR; DA. 1980; VOL. 34; NO 1; PP. 25-46; BIBL. 20 REF.Article

GRAPHITE-HALOGENS AS TEMPERATURE CALIBRATION STANDARDS FOR TRANSMISSION ELECTRON MICROSCOPYCHUNG DDL.1980; REV. SCI. INSTRUM.; ISSN 0034-6748; USA; DA. 1980; VOL. 51; NO 7; PP. 932-934; BIBL. 12 REF.Article

SEM AND TEM OBSERVATIONS OF EMITTER-COLLECTOR PIPES IN BIPOLAR TRANSISTORSGOWERS JP; BULL CJ; ASHBURN P et al.1980; J. MICR.; GBR; DA. 1980; VOL. 118; NO 3; PP. 329-336; BIBL. 15 REF.Article

CONTAMINATION AS A PSYCHOLOGICAL PROBLEMISAACSON M; KOPF D; OHTSUKI M et al.1979; ULTRAMICROSCOPY; NLD; DA. 1979; VOL. 4; NO 1; PP. 97-99; BIBL. 5 REF.Article

IMPROVED GRID HOLDERS FOR AN ALL-PURPOSE ELECTRON MICROSCOPE SPECIMEN STAGEWARBLE CE.1979; REV. SCI. INSTRUM.; USA; DA. 1979; VOL. 50; NO 5; PP. 669-671; BIBL. 2 REF.Article

ON THE INTERPRETATION OF TEM IMAGES OF P-N JUNCTIONSLOVECCHIO G; MORANDI G.1979; PHYS. STATUS SOLIDI, A; DDR; DA. 1979; VOL. 51; NO 2; PP. 383-390; ABS. FRE; BIBL. 11 REF.Article

ELEKTRONENMIKROSKOPIE - IHRE ANWENDUNG IN DER TECHNISCHEN FORSCHUNG UND ENTWICKLUNG. = MICROSCOPIE ELECTRONIQUE - SON UTILISATION DANS LA RECHERCHE ET LE DEVELOPPEMENT INDUSTRIELFUCHS E.1978; BILD U. TON.; DTSCH.; DA. 1978; VOL. 31; NO 1; PP. 15-18; BIBL. 15 REF.Article

HERSTELLUNG VON ZRO₂-FOLIEN FUER TEM = PRODUCTION DE FEUILLES DE ZRO₂ POUR LA MICROSCOPIE ELECTRONIQUE EN TRANSMISSIONMOLCK M.1978; PRAKT. METTALOGR.; DEU; DA. 1978; VOL. 15; NO 11; PP. 542-546; BIBL. 3 REF.; IDEM ENGArticle

AN ELECTRON MICROSCOPE FOR LOW MAGNIFICATION WITH A WIDE FIELDKUBOZOE M; SATO H; KASAI S et al.1978; J. ELECTRON MICR.; JPN; DA. 1978; VOL. 27; NO 2; PP. 83-87; BIBL. 2 REF.Article

AN INTEGRATED SET OF COMPUTER PROGRAMS FOR PROCESSING ELECTRON MICROGRAPHS OF BIOLOGICAL STRUCTURES.SMITH PR.1978; ULTRAMICROSCOPY; NLD; DA. 1978; VOL. 3; NO 2; PP. 153-160; BIBL. 12 REF.Article